- Crystallographic orientation of single crystal samples. Laue method.
- Single crystal cuts in a desired direction. Laue method. (together with the Optical workshop).
- X-ray phase analysis. Powder diffraction. Debye-Scherrer method (for small samples).
- Making textural analysis in a polycrystalline sample.
- Determine crystal structures using Rietveld refinement.
- Low-temperature powder diffraction (80-270K).
- Single crystal x-ray analysis (15-450K and high pressure in DAC).
- 3D microscopy and element analysis.
|
 |
|
|
|||||